The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Dec. 15, 2022
Sap SE, Walldorf, DE;
Ganesh Moorthy Duraisamy, Chinnamadham palayam, IN;
Shreepathi Kukkila, Bengaluru, IN;
Shivendu, Bengaluru, IN;
Harsini R, Bengaluru, IN;
Suhas Ramji, Bengaluru, IN;
Arvind Viswanathan, Bengaluru, IN;
Abhishek Mishra, Bengaluru, IN;
SAP SE, Walldorf, DE;
Abstract
Techniques and solutions are provided for database testing. In particular, aspects of the present disclosure facilitate 'automatic exploration' of testing of database features, such as database commands. In particular, test definitions can be created for particular database features, where a test definition can have variants. Different test definitions can be combined into a composite test, which can include different variants for different tests. An executable test can be created that allows a database to execute a composite test. The present disclose also provides techniques and solutions for analyzing test results, particularly when voluminous test results are returned. In one example, test results for multiple iterations of a test can be compared. A change in test results, for example, can cause a test result to be flagged for further review. The composite tests, or result analysis techniques, can help provide better testing of database software to help identify software errors/bugs.