The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Dec. 15, 2022
Applicant:

Honeywell International Inc., Charlotte, NC (US);

Inventor:

Ankit Singh, Apex, NC (US);

Assignee:

HONEYWELL INTERNATIONAL INC., Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3058 (2013.01); G06F 2201/86 (2013.01);
Abstract

A system and method is disclosed for automatically triggering a quality event filing in a monitored area, comprising: receiving incoming data from a plurality of connected devices in the monitored area, the incoming data including environmental data of the monitored area and user data of at least one user in the monitored area; determining, by the at least one processor, whether the incoming data is indicative of the occurrence of at least one quality event in the monitored area; and upon a determination that the incoming data is indicative of at least one quality event, generating, by the at least one processor, a quality event form with form data pre-filled, and transmitting the quality event form to a graphical user interface of a user device of at least one user in the monitored area.


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