The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

May. 25, 2020
Applicant:

Komatsu Ltd., Tokyo, JP;

Inventor:

Kazuhisa Takahama, Tokyo, JP;

Assignee:

Komatsu Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2020.01); E02F 9/26 (2006.01); G01S 7/48 (2006.01); G01S 7/51 (2006.01); G01S 17/86 (2020.01); E02F 3/32 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); E02F 9/264 (2013.01); G01S 7/4808 (2013.01); G01S 7/51 (2013.01); G01S 17/86 (2020.01); E02F 3/32 (2013.01);
Abstract

An aspect of the invention is a map generation system including a three-dimensional data acquisition unit configured to acquire three-dimensional data from a scanning distance measurement sensor measuring a distance to a target to be measured, an operation information acquisition unit configured to acquire operation information representing an operation of a work machine occurring in a cycle of update of the three-dimensional data by the scanning distance measurement sensor, a correction amount calculation unit configured to calculate a correction amount of each measurement point of the three-dimensional data based on the operation information, and a correction processing unit configured to apply the correction amount to each measurement point of the three-dimensional data to correct the three-dimensional data.


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