The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Nov. 30, 2020
Applicants:
Sameh Sarhan, Santa Clara, CA (US);
Lawrence Herbert Zuckerman, Livermore, CA (US);
Inventors:
Sameh Sarhan, Santa Clara, CA (US);
Lawrence Herbert Zuckerman, Livermore, CA (US);
Assignee:
Xtrava Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/27 (2006.01); G01N 21/64 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54388 (2021.08); G01N 21/274 (2013.01); G01N 21/6428 (2013.01); G01N 21/8483 (2013.01); G01N 2021/6439 (2013.01);
Abstract
A method, apparatus and system that illuminates one face of a lateral flow assay test strip or test strip assembly with light of selected wavelengths and intensities and measures the resulting light intensities at the opposite face at the test stain line region and adjacent regions, in order to determine the value of analyte concentration over an extremely wide range, including values too small to produce a visible test stain line.