The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Sep. 03, 2021
Applicant:

Rosen Swiss Ag, Stans, CH;

Inventors:

Eduard Blumenstein, Lingen, DE;

Marcel Schemmann, BN Maria-Hoop, NL;

Assignee:

ROSEN 2 Holding AG, Stans, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/32 (2006.01); G01N 29/24 (2006.01); G01R 31/00 (2006.01); H04B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 29/32 (2013.01); G01N 29/2412 (2013.01); G01R 31/002 (2013.01); H04B 11/00 (2013.01);
Abstract

A measurement method is provided on an electrically conducting object. A first ultrasound wave is generated in the object by means of a first EMAT transmit transducer of a measurement arrangement. A first EMAT receive transducer of the measurement arrangement detects a first receive signal. The first receive signal comprises a first ultrasound signal resulting at least partially from the first ultrasound wave which has propagated through at least a part of the object, as well as a first electromagnetic interference signal. A second receive signal is also detected comprising a second electromagnetic interference signal by means of a first receive means of the measurement arrangement. The first receive signal and the second receive signal are processed jointly. At least the first receive signal is at least partially interference-suppressed.


Find Patent Forward Citations

Loading…