The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
May. 03, 2019
Analytical Mechanics Associates, Inc., Hampton, VA (US);
William T. Yost, Newport News, VA (US);
Daniel F. Perey, Yorktown, VA (US);
Paul Petzar, Yorktown, VA (US);
John W. Connell, Yorktown, VA (US);
Frank L. Palmieri, Yorktown, VA (US);
Rodolfo I. Ledesma, Hampton, VA (US);
Joshua L. Brown, Poquoson, VA (US);
Analytical Mechanics Associates, Inc., Hampton, VA (US);
Abstract
A probe for collecting optically stimulated electron emission to inspect chemical reactions of a surface includes a light source to emit light on the surface, a collector, and a controller. The light source emits light on the surface. The collector is configured to detect photoelectrons emitted from the surface in response to the light from the light source impinging on the surface. The collector is further configured to provide a photocurrent based on the detected photoelectrons. The controller includes at least one processor and is operably coupled to the light source and the collector. The controller is configured to cause the light source to emit light on the surface, receive the photocurrent from the collector, and determine at least one chemical reaction of the surface based on the received photocurrent.