The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Mar. 06, 2020
Krones Ag, Neutraubling, DE;
Anton Niedermeier, Offenstetten, DE;
KRONES AG, Neutraubling, DE;
Abstract
Method for optically inspecting containers, where the containers are transported to an inspection unit with an illumination unit and with a camera, where light emitted from a planar light-emitting surface of the illumination unit is transmitted or reflected via said containers, where the camera records in at least one camera image at least one of the respective containers and the light transmitted or reflected via them, where the light emitted from the light-emitting surface is locally encoded on the basis of a wavelength property and is recorded by the camera in such a way that different emission locations of the light-emitting surface can be distinguished from one another in the at least one camera image, and that the image processing unit evaluates the at least one camera image for location information of the emission locations, in order to distinguish the defects from the foreign objects.