The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

May. 22, 2024
Applicant:

Finesse Technology Co., Ltd., Hsinchu County, TW;

Inventor:

Shin-Hua Tseng, Hsinchu County, TW;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/33 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/33 (2013.01); G01N 33/0027 (2013.01); G01N 2201/127 (2013.01);
Abstract

Disclosed are a device and a method for gas concentration measurement comprising a gas detection chamber, a temperature sensing element, a pressure sensing element, a light source supply device and a light sensing device for measuring a gas concentration of a to-be-measured gas (such as ozone). The temperature sensing element and the pressure sensing element respectively measure a temperature and a pressure of the to-be-measured gas. The light source supply device uses UV-LED as an ultraviolet light-emitting source, and provides a first detection light beam and a calibration light beam with different ozone absorbances, and then uses a light beam splitter to split the light beams into a split light that passes through the to-be-measured gas and a split light that does not pass through the to-be-measured gas.


Find Patent Forward Citations

Tseng, Shin-Hua. (2025). Device and method for gas concentration measurement (U.S. Patent No. 12209955). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12209955

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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