The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Jan. 31, 2023
Applicant:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Inventors:
Craig Prater, Santa Barbara, CA (US);
Kevin Kjoller, Santa Barbara, CA (US);
Roshan Shetty, Westlake Village, CA (US);
Assignee:
Photothermal Spectroscopy Corp., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/427 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01N 21/17 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/171 (2013.01); G01J 3/2823 (2013.01); G01J 3/427 (2013.01); G01J 3/4406 (2013.01); G01J 3/4412 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); G01N 2021/1714 (2013.01);
Abstract
System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.