The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Sep. 29, 2022
Applicant:

Ametek, Inc., Berwyn, PA (US);

Inventors:

Norman Kupzak, Dresden, DE;

James A. Salomon, Providence, RI (US);

Andre Stark, Radebeul, DE;

Max Fredrich, Dresden, DE;

Assignee:

AMETEK, INC., Berwyn, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 11/14 (2006.01);
U.S. Cl.
CPC ...
G01N 11/14 (2013.01);
Abstract

Devices, methods, and non-transitory computer readable media for measuring properties of a material are disclosed. A device is configured to automatically identify a property of the material such as a surface of the material as a measuring head of a spindle engages the material as the spindle is lowered. After the material surface is identified, the device is configured to automatically lower the measuring head to a predefined depth within the material with respect to the material surface. The device may measure another property of the material such as a rheological property with the measuring head at the predefined depth. The device may change the depth of the measuring head during measurement of the rheological property.


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