The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Jun. 21, 2021
Applicant:

Ams Sensors Singapore Pte. Ltd., Singapore, SG;

Inventors:

Peter Roentgen, Eindhoven, NL;

Kotaro Ishizaki, Eindhoven, NL;

Javier Miguel Sanchez, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/26 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01J 3/0259 (2013.01); G01J 3/0294 (2013.01); G01J 3/36 (2013.01); G01J 3/51 (2013.01);
Abstract

An optical sensor. The optical sensor comprises a substrate, a Fabry-Perot interferometer, and first and second photodetectors. The Fabry-Perot interferometer comprises a first mirror and a second mirror, and is mounted on the substrate such that light is transmitted through the interferometer to the substrate. The first and second photodetectors are configured to detect light transmitted through the etalon and the substrate. The first photodetector is sensitive to a first wavelength range, and the second photodetector is sensitive to a second wavelength range, and wherein the first and second wavelength ranges each correspond to a different mode of the interferometer.


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