The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
May. 25, 2022
Hexagon Metrology, Inc., North Kingstown, RI (US);
Paul Racine, Providence, RI (US);
Hexagon Metrology, Inc., North Kingstown, RI (US);
Abstract
A method measures an object having a feature. The feature has a plurality of profiles each having a surface. The method provides a coordinate measuring machine (CMM) having a wrist coupled with a measuring prob. The probe has a tolerance angle with respect to a surface normal of a surface to be measured. The wrist has a first given orientation that is adjustable to a second given orientation. The method determines an ideal vector that can be used to measure a given segment within the tolerance. The method also determines the wrist orientation in a CMM coordinate space. The method determines the ideal vector in the CMM coordinate space to define a part vector. A probe vector is determined from the wrist and probe characteristics. The probe vector is aligned with the part vector. The feature is measured.