The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Jul. 30, 2020
Applicant:

Siemens Energy Global Gmbh & Co. KG, Bayern, DE;

Inventors:

Jan Pascal Bogner, Berlin, DE;

David Rule, Seattle, WA (US);

Julius Schurb, Berlin, DE;

Fabio Witte, Gävle, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 12/45 (2021.01); B22F 10/28 (2021.01); B22F 10/366 (2021.01); B22F 10/85 (2021.01); B22F 12/41 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 12/45 (2021.01); B22F 10/28 (2021.01); B22F 10/366 (2021.01); B22F 10/85 (2021.01); B22F 12/41 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A method of applying a plurality of energy beams in the additive manufacture of a component includes a) providing a first and a second energy beam, each set up for the irradiation of a layer of a powder bed, wherein the first beam scans over a first irradiation area and the second beam scans over a second irradiation area, wherein the first and second irradiation areas are substantially arranged adjacent to each other and form part of a manufacturing plane, and b) assigning a scan vector to be scanned in the first irradiation area by the second energy beam, when a melt pool generated by the second energy beam during the scan of the vector is expected to cause less overlap with a powder bed outside of the component's geometry than a melt pool generated by the first energy beam would cause during the scan of the vector.


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