The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Jun. 24, 2019
Applicant:
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Inventors:
Azusa Ishii, Tokyo, JP;
Takashi Miwa, Tokyo, JP;
Masamitsu Watanabe, Tokyo, JP;
Soichi Oka, Tokyo, JP;
Assignee:
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 15/34 (2006.01); G01N 30/74 (2006.01); G01N 30/78 (2006.01); G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
B01D 15/34 (2013.01); G01N 30/74 (2013.01); G01N 30/78 (2013.01); G01N 30/8668 (2013.01); G01N 30/8672 (2013.01);
Abstract
A first chromatogram is obtained by analyzing a second standard sample by size exclusion chromatography analysis using a first detector. Also, a second chromatogram is obtained by analyzing a solvent for the second standard sample by size exclusion chromatography analysis using the first detector. Then, from the difference between the first chromatogram and the second chromatogram, a third elution time in size exclusion chromatography analysis of the second standard sample using the first detector is determined.