The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Dec. 22, 2022
Shenzhen Sibionics Technology Co., Ltd., Shenzhen, CN;
Pei Luo, Shenzhen, CN;
Can Peng, Shenzhen, CN;
Shishan Liu, Shenzhen, CN;
Xiaohui Xiong, Shenzhen, CN;
Jian Li, Shenzhen, CN;
Shixin Zhan, Shenzhen, CN;
Zhongzhao Chen, Shenzhen, CN;
Mingsong Han, Shenzhen, CN;
Qiang Hao, Shenzhen, CN;
SHENZHEN SIBIONICS TECHNOLOGY CO., LTD., Shenzhen, CN;
Abstract
Some embodiments of the disclosure describe an evaluation system based on analyte data including a memory storing a program, a display, and a processor. In some examples, the processor is configured to: receive analyte data during a predetermined time period from an object to be tested, acquire a plurality of analyte indicators different from each other based on the analyte data, normalize the plurality of analyte indicators to a predetermined range to acquire a plurality of normalized analyte indicators, plot a polygon pattern corresponding to the analyte data during the first time period as a target polygon pattern, plot a polygon pattern corresponding to the analyte data during the second time period as a reference polygon pattern, and take a line segment between a vertex and a center point as an axis, and display the target polygon pattern and the reference polygon pattern.