The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Feb. 09, 2022
Applicant:

National University Corporation Yamagata University, Yamagata, JP;

Inventors:

Daisuke Kumaki, Yonezawa, JP;

Shizuo Tokito, Yonezawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/0205 (2006.01); A61B 5/113 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0053 (2013.01); A61B 5/0205 (2013.01); A61B 5/113 (2013.01); A61B 5/4818 (2013.01); A61B 5/6891 (2013.01); A61B 2560/02 (2013.01);
Abstract

An evaluation test apparatus is configured to evaluate or test measurement precision of a biological information measurement device configured to measure biological information. The evaluation test apparatus includes: a function generator configured to generate a plurality of input waveform signals by a predetermined operation; an indenter configured to pressure a piezoelectric element of the biological information measurement device; a vibration driver selected from a motor and a solenoid and configured to vibrate the indenter; and a control board configured to control the vibration driver. The control board includes an adder configured to combine the plurality of input waveform signals generated by the function generator. The vibration driver vibrates the indenter based on a composite waveform signal combined by the adder.


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