The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Jan. 13, 2022
Alcon Inc., Fribourg, CH;
Daniil Nekrassov, Berlin, DE;
George Hunter Pettit, Fort Worth, TX (US);
Martin Gründig, Rangsdorf, DE;
Mark Andrew Zielke, Lake Forest, CA (US);
John Alfred Campin, Southlake, TX (US);
Alcon Inc., Fribourg, CH;
Abstract
An ophthalmic system for measuring an eye comprises measuring devices and a computer. The measuring devices comprise an optical coherence tomography (OCT) device and an aberrometer. The OCT device directs OCT light towards the eye, and detects the OCT light reflected from the eye to measure the eye. The aberrometer directs aberrometer light towards the eye, and detects the aberrometer light reflected from the eye to measure the eye. The computer generates an ocular model of the eye according to the reflected OCT light. The ocular model comprises parameters for the eye, where each parameter is assigned a value. The computer determines an OCT-based wavefront according to the ocular model, determines an aberrometer-based wavefront according to the reflected aberrometer light, ascertains a deviation between the OCT-based wavefront and the aberrometer-based wavefront, and evaluates measurements from one or more of the measuring devices according to the deviation.