The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2025
Filed:
Feb. 19, 2020
The Johns Hopkins University, Baltimore, MD (US);
Soumyadipta Acharya, Ellicott City, MD (US);
Margaret Glancey, Baltimore, MD (US);
Adam C. Goodwin, Baltimore, MD (US);
Laura Elizabeth Schiffrin Scavo, Bethesda, MD (US);
Jewell Brey, Chapel Hill, NC (US);
Tristan Ford, Baltimore, MD (US);
Collyn J. Heier, Cambridge, MA (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
An insect trap analysis system may detect an insect specimen on a trap mechanism of an insect trap. The insect trap analysis system may control, based on detecting the insect specimen on the trap mechanism, one or more mechanical devices to: adjust a position of the insect specimen relative to a position of an image capture device associated with the insect trap, or adjust the position of the image capture device relative to the position of the insect specimen. The insect trap analysis system may cause, while controlling the one or more mechanical devices to adjust the position of the image capture device or the position of the insect specimen, the image capture device to capture a plurality of images of the insect specimen from a plurality of different angles relative to the insect specimen, and may perform an action associated with the plurality of images.