The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Aug. 20, 2019
Applicants:

Iucf-hyu (Industry-university Cooperation Foundation Hanyang University), Seoul, KR;

Infoseize Systems Co. Ltd., Seoul, KR;

Inventor:

Hi Chan Moon, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04B 17/336 (2015.01); H04W 24/10 (2009.01); H04W 72/0453 (2023.01); H04W 72/21 (2023.01); H04W 72/541 (2023.01); H04W 76/11 (2018.01);
U.S. Cl.
CPC ...
H04W 64/006 (2013.01); H04B 17/336 (2015.01); H04W 24/10 (2013.01); H04W 72/0453 (2013.01); H04W 72/21 (2023.01); H04W 72/541 (2023.01); H04W 76/11 (2018.02);
Abstract

The present disclosure relates to a method and a device for acquiring location information of a terminal by using a wireless communication system. A signal measurement device comprises: an information acquisition unit for acquiring at least one among an uplink signal of a target terminal, or identification information of a terminal which is potentially an interference source in the transmission of the uplink signal; a communication unit capable of communicating with a base station or a location measurement server; and a control unit for, on the basis of the uplink signal, generating information on the occurrence of an interference to the uplink signal of the target terminal, or generating interference source information including the identification information of the terminal which is potentially an interference source.


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