The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Feb. 01, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Eunseung Yun, Suwon-si, KR;

Gyeonghan Cha, Suwon-si, KR;

Jaehyuck Kang, Suwon-si, KR;

Daechul Kwon, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 25/69 (2023.01); H04N 17/00 (2006.01); H04N 25/78 (2023.01);
U.S. Cl.
CPC ...
H04N 25/69 (2023.01); H04N 17/002 (2013.01); H04N 25/78 (2023.01);
Abstract

An image sensor includes a test image generator configured to receive pixel data of a group of pixels including channel that corresponds to a size of a plurality of row regions of a pixel array that includes the plurality of row regions and a plurality of column regions, and is configured to generate test image data based on the pixel data, and an interface configured to transmit the test image data from the test image generator to a test device. The test image generator is configured to divide the pixel data into a first column region corresponding to 2n-th column region of the column regions of the pixel data and a second column region corresponding to 2n−1-th column region of the column regions of the pixel data and configured to generate a test image based on the first column region.


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