The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Mar. 12, 2024
Applicant:

Enpower, Inc., Indianapolis, IN (US);

Inventors:

Kjell William Schroder, Medford, MA (US);

Adrian Yao, Palo Alto, CA (US);

Neelam Singh, Fremont, CA (US);

Assignee:

EnPower, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/62 (2006.01); H01G 9/00 (2006.01); H01G 9/04 (2006.01); H01G 11/04 (2013.01); H01G 11/26 (2013.01); H01G 11/28 (2013.01); H01G 11/38 (2013.01); H01M 4/04 (2006.01); H01M 4/13 (2010.01); H01M 4/139 (2010.01); H01M 10/0525 (2010.01); H01G 11/32 (2013.01); H01G 11/46 (2013.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/62 (2013.01); H01G 9/0029 (2013.01); H01G 9/04 (2013.01); H01G 11/04 (2013.01); H01G 11/26 (2013.01); H01G 11/28 (2013.01); H01G 11/38 (2013.01); H01M 4/0402 (2013.01); H01M 4/0404 (2013.01); H01M 4/0409 (2013.01); H01M 4/0411 (2013.01); H01M 4/0416 (2013.01); H01M 4/043 (2013.01); H01M 4/13 (2013.01); H01M 4/139 (2013.01); H01M 10/0525 (2013.01); H01G 11/32 (2013.01); H01G 11/46 (2013.01); H01M 2004/021 (2013.01);
Abstract

Methods are disclosed for manufacturing an electrode for use in a device such as a secondary battery. Electrodes may include a first layer having first active particles adhered together by a binder, a second layer having second active particles adhered together by a binder, and an interphase layer interposed between the first and second layers. In some examples, the interphase layer may include an interpenetration of the first and second particles, such that substantially discrete fingers of the first layer interlock with substantially discrete fingers of the second layer.


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