The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Mar. 31, 2021
Applicant:

Milan Pophristic, Princeton, NJ (US);

Inventor:

Milan Pophristic, Princeton, NJ (US);

Assignee:

MSTM, LLC, Newark, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01); G01N 27/623 (2021.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01); H01J 49/16 (2006.01); H01J 49/24 (2006.01);
U.S. Cl.
CPC ...
H01J 49/04 (2013.01); G01N 27/623 (2021.01); H01J 49/0027 (2013.01); H01J 49/0409 (2013.01); H01J 49/0418 (2013.01); H01J 49/0495 (2013.01); H01J 49/067 (2013.01); H01J 49/164 (2013.01); H01J 49/165 (2013.01); H01J 49/24 (2013.01);
Abstract

An ionizing system includes a flange device for connection to a mass spectrometer or ion mobility spectrometer having the property of providing a barrier between the lower pressure region of the spectrometer and a higher pressure region substantially at atmospheric pressure, and a channel therethrough providing fluid communication between the higher and lower pressure regions. A plate device independent of the flange device which can accommodate multiple samples, such as a sample plate device, when placed over the channel in the flange device substantially seals the channel Sliding the sample plate device while in intimate contact with the flange device provides a means to sequentially and rapidly expose said samples to the opening of the channel and thus the lower pressure region. Samples are ionized when exposed to the lower pressure region in as little as one sample per second using multiple ionization methods.


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