The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Dec. 25, 2020
Applicant:

Japanese Foundation for Cancer Research, Tokyo, JP;

Inventor:

Noriko Yamamoto, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/69 (2022.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06V 10/267 (2022.01); G06V 10/764 (2022.01); G06V 10/7715 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01); G06V 20/693 (2022.01); G16H 10/40 (2018.01); G16H 30/40 (2018.01);
Abstract

Diagnosis is assisted by acquiring microscopical observation image data while specifying the position, classifying the image data into histological types with the use of AI, and reconstructing the classification result in a whole lesion. There is provided a pathological diagnosis assisting method that can provide an assistance technology which performs a pathological diagnosis efficiently with satisfactory accuracy by HE staining which is usually used by pathologists. Furthermore, there are provided a pathological diagnosis assisting system, a pathological diagnosis assisting program, and a pre-trained model.


Find Patent Forward Citations

Loading…