The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Jul. 25, 2023
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Eran Moshe, Kfar Saba, IL;

Pavel Teper, Kfar Saba, IL;

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01);
Abstract

Techniques are provided for capturing a processing state snapshot of a device under test (DUT) that enable a previous test run to be restored and resumed from the same point the snapshot was taken. The techniques enable restoring the snapshot into the same or a different device to resume a previous test run. In an illustrative example, a DUT is controlled by a Joint Test Action Group (JTAG) test controller to capture a Steady State Snapshot by controlling peripheral components of the DUT to complete any on-going tasks to reach a steady state and then flush data to a memory of the DUT. The flushed steady state peripheral component data and other processing state data is transferred to the test controller for analysis and for enabling the subsequent restore and resume operation. Solid state drive (SSD) examples are provided.


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