The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Dec. 27, 2021
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Chung-Yu Wu, New Taipei, TW;
Chin-Pin Kuo, New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
In an image comparison method, an original reference image and an original test image are obtained. The original reference image and the original test image are binarized to obtain a reference binary image and a test binary image. The reference binary image and the test binary image are detected edges to obtain a reference edge image and a test edge image. A morphological expansion is performed on the reference edge image to obtain an expanded reference edge image. An OR operation is performed on the extended reference edge image and the test edge image to obtain an extended test edge image. An XOR operation is performed on the expanded reference edge image and the expanded test edge image. The method improves the accuracy of image comparison.