The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Mar. 18, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Jiping Liao, Beijing, CN;

Xiaofei Jia, Beijing, CN;

Yingqiang Zhang, Shenzhen, CN;

Shuxin Ouyang, Shenzhen, CN;

Yu Li, Shenzhen, CN;

Liang Wu, Shanghai, CN;

Heng Sun, Shenzhen, CN;

Shaokang Ma, Shenzhen, CN;

Xingguang Song, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G06T 7/596 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A method and an apparatus for obtaining an extended depth of field image, where the method includes: determining a target focal length range based on an initial focal length, where the target focal length range includes the initial focal length; obtaining a plurality of images of a photographed object for a plurality of focal lengths in the target focal length range; and registering and fusing the plurality of images to obtain an extended depth of field image. The target focal length range of concern to a user is selected based on the initial focal length, such that there is no need to obtain images of all focal lengths of a lens, a quantity of obtained images and processing time of registration and fusion can be reduced.


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