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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12205288 B1

PDFFull Text
Date of Patent:
Jan. 21, 2025

Filed:

Mar. 30, 2023

Method and system for analyzing pathological image

Applicant:

Lunit Inc., Seoul, KR;

Inventors:

Chan-Young Ock, Seoul, KR;

Donggeun Yoo, Seoul, KR;

Kyunghyun Paeng, Seoul, KR;

Assignee:

Lunit Inc., Seoul, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Vu Le

Assistant Examiner:

Winta Gebreslassie

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/94 (2022.01); G06V 20/69 (2022.01); G16H 30/20 (2018.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06V 10/945 (2022.01); G06V 20/695 (2022.01); G16H 30/20 (2018.01); G06T 2207/20092 (2013.01); G06T 2207/30096 (2013.01); G06V 2201/03 (2022.01);
Abstract

The present disclosure relates to a method, performed by at least one processor of an information processing system, of analyzing a pathological image. The method includes receiving a pathological image, detecting an object associated with medical information, in the received pathological image by using a machine learning model, generating an analysis result on the received pathological image, based on a result of the detecting, and outputting medical information about at least one region included in the pathological image, based on the analysis result.

Find Patent Forward Citations

Ock, Chan-Young. (2025). Method and system for analyzing pathological image (U.S. Patent No. 12205288). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12205288

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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