The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Feb. 09, 2022
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Imperial College Innovations Limited, London, GB;

Inventors:

Alistair Smith, London, GB;

Myungshik Kim, London, GB;

Chris Self, London, GB;

Kiran Khosla, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 10/70 (2022.01);
U.S. Cl.
CPC ...
G06N 10/70 (2022.01);
Abstract

A method of measuring states of qubits of a quantum processor, the method includes providing, to the qubits, a control signal to control states of n qubits in the quantum processor, where n is a natural number; performing a bit-flip to invert a state of at least one qubit of the qubits; reading out output qubit values of bit-flipped qubits based on the performing of the bit-flip; and generating an error model indicating a probability of occurrence of measurement errors in the output qubit values based on a result of the reading-out of the output qubit values.


Find Patent Forward Citations

Smith, Alistair. (2025). Quantum system and method of measuring states of qubits of quantum processor (U.S. Patent No. 12204998). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12204998

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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