The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Oct. 25, 2019
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Kevin Satzinger, Goleta, CA (US);

Charles Neill, Goleta, CA (US);

Julian Shaw Kelly, Santa Barbara, CA (US);

Andrew Dunsworth, Goleta, CA (US);

Assignee:

Google LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 10/20 (2022.01); G06N 10/70 (2022.01);
U.S. Cl.
CPC ...
G06N 10/20 (2022.01); G06N 10/70 (2022.01);
Abstract

Methods, systems and apparatus for benchmarking quantum computing hardware. In one aspect, a method includes defining an initial circuit configured to operate on an array of qubits, wherein the initial circuit comprises multiple instances of the two-qubit gate, wherein each instance of the two-qubit gate performs a same operation on a respective pair of neighboring qubits in the array; partitioning the initial circuit into multiple layers, wherein instances of the two-qubit gate in a respective layer can be implemented in parallel; for each of the multiple layers: constructing benchmarking circuits for the layer, wherein each benchmarking circuit for the layer comprises one or more cycles of quantum gates, each cycle comprising: the layer of instances of the two-qubit gate, and a plurality of single qubit gates; implementing the constructed benchmarking circuits to obtain experimental benchmarking data; and adjusting control parameters of the control model using the experimental benchmarking data.


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