The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Nov. 16, 2021
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

MohamadAli Torkamani, Scarsdale, NY (US);

Bhavna Soman, Seattle, WA (US);

Jeffrey Earl Bickford, Thornton, CO (US);

Baris Coskun, Seattle, WA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/56 (2013.01); G06F 21/57 (2013.01); G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 21/566 (2013.01); G06N 20/20 (2019.01);
Abstract

Disclosed are systems and methods to compare two or more machine learning models to determine the comparative performance of those models. Markers may be assigned to data items and data item marker scores generated for those data items, independent of the machine learning models. Each of the machine learning models to be compared may then process the data items and generate respective model scores for those data items. A sub-set of the data items may then be generated for each machine learning model based on the model scores assigned to the data items by the respective model. A model marker score may then be computed for each machine learning model based on the marker scores assigned to each of the data items of the sub-set of data items determined for each model. Finally, the model marker scores may be compared to determine which machine learning model has the highest performance.


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