The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Jun. 18, 2020
Nec Corporation, Tokyo, JP;
Hikaru Tsuchida, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An assessment apparatus is able to access a surrogate model generation apparatus that comprises a query generation part that generates a first query causing an assessment target model to make an inference to obtain an inference result; an MIA execution part that executes a membership inference attack using as an input the inference result obtained by sending the first query to the assessment target model and infers virtual training data used to train the assessment target model; and a surrogate model generation part that uses the virtual training data to generate a surrogate model that emulates the behavior of the assessment target model, and the assessment apparatus comprises a security assessment part that transmits a second query to both the surrogate model and the assessment target model to assess the security of the assessment target model using the results therefrom.