The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Apr. 29, 2022
Applicant:

Dynatrace Llc, Waltham, MA (US);

Inventors:

Herwig Moser, Freistadt, AT;

Martin Carpella, Katsdorf, AT;

Otmar Ertl, Linz, AT;

Assignee:

Dynatrace LLC, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 11/3006 (2013.01); G06F 16/288 (2019.01); G06F 2201/835 (2013.01);
Abstract

Technologies are disclosed for the automated, rule-based generation of models from arbitrary, semi-structured observation data. Context data of received observation data, like data describing the location of on which a phenomenon was observed, is used to identify related observations, to generate entities in a model describing the observed data and to assign observations to model data. Mapping rules may be used for the on-demand generation of models, and different sets of mapping rules may be used to generate different models out of the same observation data for different purposes. Further, observation time data may be used to observer the temporal evolution of the generated model. Possible use cases of the so generated models include the interpretation of observation data that describes unexpected operation conditions in view of the generated model, or to determine how a monitored system reacts on changing conditions, like increased load.


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