The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Jun. 25, 2021
Applicant:

Sigtuple Technologies Private Limited, Bangalore, IN;

Inventors:

Abhishek Shukla, New Delhi, IN;

Ashish Kumar Lal, Bangalore, IN;

Avilash, Jharkhand, IN;

Neha Dixit, Bangalore, IN;

Deepanker, New Delhi, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/34 (2006.01);
U.S. Cl.
CPC ...
G02B 21/34 (2013.01); G02B 21/26 (2013.01);
Abstract

The present disclosure discloses a calibration slide for calibration of an automated microscope. The slide includes at least one calibration zone defined on at least one major surface of the sample slide. The at least one calibration zone is divided by a cross hair to define a plurality of quadrants. Each of the plurality of quadrants is defined with an array of apertures of varying density of arrays. The automated microscope including the calibration slide of the present disclosure enables corrective maintenance. The method of the present disclosure may be employed across various automated microscopes within a lab or at labs at various locations through offline/online mode to achieve similar results when tested on same sample.


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