The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
May. 25, 2023
International Business Machines Corporation, Armonk, NY (US);
Hillel Mendelson, Glen Iris, AU;
Idan Horowitz, Haifa, IL;
Karen Holtz, Jerusalem, IL;
Dani Szebenyi, Moran, IL;
Ido Plat, Shimshit, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer system, computer readable storage medium, and computer-implemented method for generating a test program for a device-under-test (DUT). The method includes transmitting a plurality of uncompiled snippets and a plurality of uncompiled micro-functions into a compiler. The method also includes selecting, randomly, a portion of uncompiled micro-functions from the plurality of uncompiled micro-functions. The method further includes compiling the uncompiled snippets and the portion of uncompiled micro-functions, thereby generating a plurality of compiled snippets and a compiled portion of micro-functions. The method also includes interweaving, randomly, the compiled portion of micro-functions with the plurality of compiled snippets, thereby at least partially generating a test program for the DUT. The method further includes executing one or more post-silicon validation tests for the DUT with the test program.