The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Nov. 22, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventor:

Takumi Yamada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); A61L 27/16 (2006.01); A61L 27/56 (2006.01); B01F 23/00 (2022.01); B01F 23/41 (2022.01); B01F 101/23 (2022.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B23Q 17/24 (2006.01); C07K 14/705 (2006.01); C08F 220/56 (2006.01); C08L 33/26 (2006.01); C12M 1/34 (2006.01); C12Q 1/04 (2006.01); C12Q 1/18 (2006.01); C12Q 1/6844 (2018.01); C12Q 1/686 (2018.01); G01N 1/31 (2006.01); G01N 15/00 (2024.01); G01N 15/02 (2024.01); G01N 21/17 (2006.01); G01N 21/3577 (2014.01); G01N 21/359 (2014.01); G01N 21/39 (2006.01); G01N 21/45 (2006.01); G01N 21/64 (2006.01); G01N 21/77 (2006.01); G01N 21/78 (2006.01); G01N 27/10 (2006.01); G01N 27/414 (2006.01); G01N 30/12 (2006.01); G01N 30/68 (2006.01); G01N 30/70 (2006.01); G01N 30/72 (2006.01); G01N 30/88 (2006.01); G01N 33/00 (2006.01); G01N 33/18 (2006.01); G01N 33/50 (2006.01); G01N 33/53 (2006.01); G01N 33/543 (2006.01); G01N 33/68 (2006.01); G01N 33/74 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01); G06T 7/00 (2017.01); G06T 7/90 (2017.01); H10K 10/46 (2023.01); H10K 85/00 (2023.01); H10K 85/20 (2023.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 35/0095 (2013.01); G01N 2035/00831 (2013.01);
Abstract

Since the measurement start timings for a plurality of specimens in different test fields deviate from one another, the measurement results are not coordinated, leading to a delay in reporting. When determining an order for measuring a newly recognized specimen using an automated analysis device capable of performing measurements in a plurality of test fields, the measurement order for specimens waiting to be measured is changed to minimize the time difference between measurement result output timings for a plurality of specimens for the same patient, with reference to specimen information such as urgent test information, a measurement completion time, and an earliest measurement completion time for other specimens, relating to the patient's other specimens having the same patient number in the specimen information.


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