The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Nov. 22, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Takumi Yamada, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
Since the measurement start timings for a plurality of specimens in different test fields deviate from one another, the measurement results are not coordinated, leading to a delay in reporting. When determining an order for measuring a newly recognized specimen using an automated analysis device capable of performing measurements in a plurality of test fields, the measurement order for specimens waiting to be measured is changed to minimize the time difference between measurement result output timings for a plurality of specimens for the same patient, with reference to specimen information such as urgent test information, a measurement completion time, and an earliest measurement completion time for other specimens, relating to the patient's other specimens having the same patient number in the specimen information.