The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Dec. 21, 2021
Fronius International Gmbh, Pettenbach, AT;
Helmut Ennsbrunner, Pettenbach, AT;
Fronius International GmbH, Pettenbach, AT;
Abstract
In a method and device for assessing the quality of a processing operation, a workpiece with specific processing parameters is processed along a processing trajectory. The (X), wherein the processing result is measured by at least one sensor and at least one sensor signal is recorded and at least one quality parameter is determined based on at least one sensor signal and the at least one quality parameter is compared with quality parameter threshold values to assess the quality of the processing result. During the assessment of the processing operation quality, changes made to the processing parameters from target values during the processing are automatically taken into consideration, in that, instead of the quality parameter threshold values, quality parameter threshold values adapted to the changes in the processing parameters are determined, and the at least one quality parameter for assessing the quality of the processing result is compared with the adapted quality parameter threshold values.