The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Aug. 12, 2022
Applicant:
Nima Acquisition, Llc, Northfield, IL (US);
Inventors:
Scott Sundvor, San Francisco, CA (US);
Ian Wallhead, San Francisco, CA (US);
Joseph Horrell, San Francisco, CA (US);
John Artiuch, San Francisco, CA (US);
Dane Weitmann, San Francisco, CA (US);
Stephen Wilson, San Francisco, CA (US);
Steven Portela, San Francisco, CA (US);
Jingqing Zhang, San Francisco, CA (US);
Francisco Dias Lourenco, San Francisco, CA (US);
Assignee:
NIMA Partners, Inc., Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 21/17 (2006.01); G01N 33/02 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54366 (2013.01); G01N 21/17 (2013.01); G01N 33/02 (2013.01); G01N 33/5308 (2013.01); G01N 2021/1765 (2013.01);
Abstract
A method includes capturing a signal of a detection substrate exposed to a sample containing a target substance; determining that the detection substrate is in a testable state; and generating an assessment of the presence of the target substance in the sample.