The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Nov. 23, 2022
Lg Electronics Inc., Seoul, KR;
Kyoungtaek Lim, Seoul, KR;
Taekyu Choi, Seoul, KR;
Younghwan Kim, Seoul, KR;
Seonggeun Kim, Seoul, KR;
Changseok Kim, Seoul, KR;
Kyungho Kong, Seoul, KR;
Kyounghwa Kim, Seoul, KR;
Youngrae Lee, Seoul, KR;
Inkwan Yeo, Seoul, KR;
LG ELECTRONICS INC., Seoul, KR;
Abstract
Provided is a probe device for testing a sensor chip that detects a target material from an analysis specimen, has a reactant reacting specifically with the target material, and transmits a generated electrical signal through a pad. The probe device can include a lower housing accommodating a circuit board electrically connectable to an external test device; a middle housing positioned on the lower housing, coupled to the lower housing, and having the sensor chip mounted thereon; a probe module having probe pins for connecting a pad of the sensor chip and a connection pad of the circuit board to each other; and an upper housing positioned on the middle housing, coupled to the middle housing, having a recessed portion that opens the sensor chip, and having a guide area for aligning the probe module on the pads of the sensor chip and the circuit board.