The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Apr. 04, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Hiroshi Takemoto, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An ultrasonic testing device includes: a signal acquiring unit which receives a reflected echo signal relating to a reflected echo of ultrasonic waves from an object being inspected, a defect detecting unit which detects a defect of the object being inspected on the basis of the reflected echo signal, and a display unit which displays the detection result of the defect detecting unit. The defect detecting unit uses the maximum signal strength of the reflected echo signal exceeding a first threshold value to detect the defect. The first threshold value is a value with which the signal strength is less than the maximum signal strength of the reflected echo signal from the surface of the object, using as an evaluation range an interval between a position which is positioned a first distance from the surface of the object and a bottom surface of the object.