The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Nov. 13, 2023
Bfly Operations, Inc., Burlington, MA (US);
Chao Chen, Madison, CT (US);
Youn-Jae Kook, Winchester, MA (US);
Jihee Lee, Seoul, KR;
Kailiang Chen, Branford, CT (US);
Leung Kin Chiu, Branford, CT (US);
Joseph Lutsky, Los Altos, CA (US);
Nevada J. Sanchez, Guilford, CT (US);
Sebastian Schaetz, Leipzig, DE;
Hamid Soleimani, Guilford, CT (US);
BFLY OPERATIONS, INC., Burlington, MA (US);
Abstract
Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.