The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Mar. 04, 2022
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventor:
Takashi Usui, Saitama, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/14 (2006.01); G01N 29/04 (2006.01); G01N 29/07 (2006.01); G01N 29/22 (2006.01); G01N 29/40 (2006.01); G01N 29/42 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/14 (2013.01); G01N 29/041 (2013.01); G01N 29/07 (2013.01); G01N 29/223 (2013.01); G01N 29/40 (2013.01); G01N 29/42 (2013.01); G01N 29/4463 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/0421 (2013.01); G01N 2291/0422 (2013.01); G01N 2291/0423 (2013.01); G01N 2291/0427 (2013.01); G01N 2291/2626 (2013.01);
Abstract
An inspection system includes one or more sensors. The one or more sensors detect second elastic waves emitted to the outside of a shaft-shaped inspection object due to first elastic waves propagating through the shaft-shaped inspection object. The one or more sensors are fixedly placed at positions away from the shaft-shaped inspection object and the directivity direction of the sensor is inclined at a predetermined angle with respect to an axial line of the shaft-shaped inspection object.