The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 21, 2025

Filed:

Jun. 02, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Hung-Chih Chang, Hsinchu, TW;

Yao-Long Tsai, Kaohsiung, TW;

Li-Hua Wang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01); G01N 29/14 (2006.01); G01N 29/24 (2006.01); G01N 29/34 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06N 20/10 (2019.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01); G01N 29/14 (2013.01); G01N 29/348 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06N 20/10 (2019.01); G01N 2291/0289 (2013.01);
Abstract

An acoustic resonance diagnostic method for detecting structural degradation is provided. The method includes steps as follows: Firstly, a training model is built using a deep neural network. At least two training acoustic signals are inputted to the training model to carry a training. A diagnostic model is built according to a result of the training using a CNN. A plurality of under-test sound wave signals are captured from an under-test section of an under-test structure. An AI is used to filter data invalid for detecting structural degradation from the under-test sound wave signals. A structural degradation state of the under-test section is determined according to a remaining portion of the under-test sound wave signals through the diagnostic model.


Find Patent Forward Citations

Chang, Hung-Chih. (2025). Acoustic resonance diagnostic method for detecting structural degradation and system applying the same (U.S. Patent No. 12203890). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12203890

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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