The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Jan. 20, 2021
Fujifilm Corporation, Tokyo, JP;
Naoyuki Nishikawa, Ashigara-kami-gun, JP;
Yoshihiro Aburaya, Ashigara-kami-gun, JP;
Kenichi Moriwaki, Ashigara-kami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the invention is to provide a method for detecting an objective substance, by which a plurality of kinds of objective substances can be detected by a single detection, in the detection of an objective substance from an analyte by utilizing magnetic force. In a case where an objective substance is detected by causing magnetic particles and labeling particles to bind to an objective substance and causing a conjugate thereof to move by magnetic force, the object is addressed by using a plurality of labeling particles including first labeling particles that bind to at least a first objective substance, and second labeling particles that bind to the first objective substance and bind to an objective substance to which the first labeling particles do not bind; and detecting an objective substance with a combination of bound labeling particles, the labeling particles satisfying at least one of a first condition that the particle sizes are different or a second condition that the signal lights generated upon light irradiation are different.