The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Sep. 19, 2024
Florida Polytechnic University, Lakeland, FL (US);
Nathan Dawson, Lakeland, FL (US);
Hengzhou Liu, Lakeland, FL (US);
Anthony Fiorito, III, Lakeland, FL (US);
Florida Polytechnic University, Lakeland, FL (US);
Abstract
The invention concerns an apparatus for scanning the optical properties of materials using a stationary sample stage and a dual-axis rotational system. The apparatus includes motors for azimuthal and polar rotation, supporting an optical system with adjustable lenses and filters to collect data from multiple angles. This design is particularly advantageous for photo-excited materials using linearly polarized sources, as it maintains static pump polarization, eliminating the need for additional motors or optical elements to align the pump with the sample's rotation. This avoids complications with halfwave plates and broadband retarders, which may not preserve linear polarization across all wavelengths. The modular system accommodates various detectors, ensuring versatility while enabling precise, high-resolution spectral imaging. The stationary sample stage prevents alignment issues and distortion, providing consistent and accurate measurements of materials' optical properties across a range of experimental setups.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile