The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Jun. 21, 2021
Soochow University, Suzhou, CN;
Yahong Chen, Suzhou, CN;
Deming Peng, Suzhou, CN;
Yonglei Liu, Suzhou, CN;
Fei Wang, Suzhou, CN;
Yangjian Cai, Suzhou, CN;
SOOCHOW UNIVERSITY, Suzhou, CN;
Abstract
An optical imaging system and a method based on spatial structure engineering of random light are disclosed. The method includes performing scattering processing on transmitted light to obtain a to-be-measured light; splitting polarization of the to-be-measured light. One light is split into x-polarized and y-polarized beams, and the other one is firstly combined with a reference beam and then split into x-polarized and y-polarized beams; measuring the intensity distributions of x-polarized and y-polarized parts of the to-be-measured light, the combined light, and the reference light; obtaining a real part and an imaginary part of the cross spectral density of the to-be-measured light, retrieving the intensity distribution of the light on the scattering medium and calculating the intensity to obtain the shape and location of the object to be measured.