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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12203835 B1

PDFFull Text
Date of Patent:
Jan. 21, 2025

Filed:

Apr. 03, 2020

Fine ratio measuring method and apparatus

Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Toshiki Tsuboi, Tokyo, JP;

Naoshi Yamahira, Tokyo, JP;

Assignee:

JFE STEEL CORPORATION, Tokyo, JP;

Attorney:

Oliff PLC

Primary Examiner:

Manish S Shah

Assistant Examiner:

Christian T Bryant

Int. Cl.
CPC ...
G01N 15/0205 (2024.01); C21B 5/00 (2006.01); C21B 7/24 (2006.01); F27B 1/28 (2006.01); G01N 15/02 (2024.01); G01N 15/075 (2024.01); G01N 33/00 (2006.01); G01N 33/24 (2006.01); F27D 19/00 (2006.01); F27D 21/02 (2006.01); G01N 15/00 (2024.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); C21B 5/00 (2013.01); C21B 5/006 (2013.01); C21B 5/007 (2013.01); C21B 7/24 (2013.01); C21B 2300/04 (2013.01); F27B 1/28 (2013.01); F27D 2019/0003 (2013.01); F27D 2021/026 (2013.01); G01N 2015/0061 (2013.01); G01N 15/02 (2013.01); G01N 15/075 (2024.01); G01N 2021/1765 (2013.01); G01N 33/00 (2013.01); G01N 33/24 (2013.01);
Abstract

A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

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