The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Jul. 02, 2024
Nanjing University of Information Science & Technology, Nanjing, CN;
NANJING UNIVERSITY OF INFORMATION SCIENCE & TECHNOLOGY, Nanjing, CN;
Abstract
A photogrammetric ground control point quality evaluation method based on Monte Carlo test relates to the field of photogrammetry technology. Firstly, aerial photographs and ground control points from a survey area are obtained, the ground control points are numbered, the aerial photographs are performed with point-placing and aerial triangulation densification. Secondly, a Monte Carlo test experiment is designed, a certain number of the ground control points are selected as control points with the rest as check points, ensuring each ground control point as the control point a certain number of times, and average errors of the ground control points are calculated. Thirdly, average values of the average errors of the ground control points are calculated, standard deviations of the average errors of the ground control points are calculated. Finally, a quality coefficient Q of each ground control point is calculated and evaluated according to quality evaluation standards.