The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Dec. 22, 2022
Applicant:
10x Genomics, Inc., Pleasanton, CA (US);
Inventors:
Monica Nagendran, Pleasanton, CA (US);
Jonathan Cheng, Pleasanton, CA (US);
Eswar Prasad Ramachandran Iyer, Oakland, CA (US);
Assignee:
10x Genomics, Inc., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6841 (2018.01); C12Q 1/6806 (2018.01); C12Q 1/6844 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/6841 (2013.01); C12Q 1/6806 (2013.01); C12Q 1/6844 (2013.01); C12Q 2600/16 (2013.01);
Abstract
Provided herein are methods for determining the mislocalization of an analyte by capturing the analyte on an array and measuring the mislocalization distance.
Nagendran, Monica. (2025). Methods of measuring mislocalization of an analyte (U.S. Patent No. 12203134). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12203134
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile