The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Jan. 23, 2024
Symbotic Canada, Ulc, Lafontaine Montreal, CA;
Christian Simon, Laval, CA;
William Légaré, Terrebonne, CA;
Samy Metari, Montreal, CA;
Alexandre Dumais, Montreal, CA;
Symbotic Canada, ULC, , CA;
Abstract
An inspection apparatus, for inspection of cased goods, includes at least one conveyor, at least one camera for capturing case image data of each of the cased goods advanced with the at least one conveyor past the inspection apparatus, and a processor configured to receive the case image data from the at least one camera. The processor is configured to characterize, from the case image data, a case exterior protrusion of the case good as a case flap in open condition, wherein the processor is configured to resolve the case image data and determine the case exterior protrusion is a coherent planar surface, and is programmed with a parameter array of physical characteristic parameters that describe case flap coherency attributes determinative of the coherent planar surface defining an open case flap condition.