The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 2025
Filed:
Sep. 12, 2019
Koninklijke Philips N.v., Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to a calculation device () for comparing dark-field X-ray images. The calculation device in () is configured for receiving a first dark-field X-ray image () describing first dark-field X-ray signals of a patient at an expiration state and for receiving a second dark-field X-ray image () describing second dark-field X-ray signals of the patient at an inspiration state. The calculation device is further () configured for normalizing the first dark-field X-ray signals of the first dark-field X-ray tin image () with a lung thickness value describing the lung thickness at the expiration state and for normalizing the second dark-field X-ray signals of the second dark-field X-ray image () with a lung thickness value describing the lung thickness at the inspiration state. Further, the calculation device () is configured for comparing the normalized first dark-field X-ray signals with the normalized second dark-field X-ray signals, thereby determining a comparison result () and for determining whether at least one area of the patient's lung with a ventilation defect exists based on the comparison result ().